Evolution of structure and residual stress of a fcc/hex-AlCrN multi-layered system upon thermal loading revealed by cross-sectional X-ray nano-diffraction

Evolution of structure and residual stress of a fcc/hex-AlCrN multi-layered system upon thermal loading revealed by cross-sectional X-ray nano-diffraction

Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Acta Materialia - Volume 162, 1 January 2019, Pages 55-66

N. Jäger, S. Klima, H. Hruby, J. Julin, M. Burghammer, J.F. Keckes, C. Mitterer, R. Daniel,