کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1540485 | 996662 | 2008 | 4 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Confocal white light reflection imaging for characterization of metal nanostructures
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
مواد الکترونیکی، نوری و مغناطیسی
پیش نمایش صفحه اول مقاله
چکیده انگلیسی
A simple far-field confocal white light reflection imaging system was proposed using a xenon (Xe) lamp as the incident light source. The best spatial resolution was determined to be about 410 nm. Localized surface plasmons (LSPs) of isolated single and dimer gold nanospheres were studied and the resonance energy difference between their LSPs was extracted. Polarization dependent reflection imaging and contrast spectrum of single silver nanowires were also investigated, which correlate closely with the polarization dependent excitation of their LSP.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Optics Communications - Volume 281, Issue 21, 1 November 2008, Pages 5360–5363
Journal: Optics Communications - Volume 281, Issue 21, 1 November 2008, Pages 5360–5363
نویسندگان
C.L. Du, Y.M. You, J. Kasim, Z.H. Ni, T. Yu, C.P. Wong, H.M. Fan, Z.X. Shen,