کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1663835 1517995 2016 10 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Iron pyrite thin films grown through a one-step annealing of iron oxide using sulfur sources, tert-butyl disulfide and H2S
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
Iron pyrite thin films grown through a one-step annealing of iron oxide using sulfur sources, tert-butyl disulfide and H2S
چکیده انگلیسی


• Growth of pyrite films using oxide precursors
• Formation of pyrite phase without the need of sodium
• Stoichiometric thin films of pyrite obtained
• Pyrite films also grown on flexible glass substrates

In this work, we report synthesis of pyrite thin films using tert-butyl disulfide (TBDS) and hydrogen sulfide (H2S) in one-step atmospheric pressure sulfurization of iron oxide films at 400 °C on a soda-lime glass, molybdenum coated soda-lime glass and sodium-free glass substrates. The iron pyrite thin films grown using TBDS did not require the presence of sodium to form the pyrite phase, whereas H2S grown pyrite thin films did. It was observed that the pyrite formation and thus the sulfur diffusion into the oxide film was slower in TBDS compared to H2S. The synthesized films were characterized for their surface morphology and phase identification using scanning electron microscopy, transmission electron microscopy (TEM), X-ray diffraction (XRD) and X-ray photoelectron spectroscopy (XPS) techniques. The S:Fe atomic ratio as well as their chemical bonding states were monitored to obtain and maintain a stoichiometric 2:1 ratio through the entire film thickness as a function of the sulfurization time by performing an XPS depth profile. Transmittance measurements confirmed the pyrite phase with an optical bandgap of 1.15 eV. The TEM electron-beam diffraction spots were used to verify the impurity phases observed in XRD patterns. Hall Effect measurements showed p-type carriers for the pyrite films.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Thin Solid Films - Volume 615, 30 September 2016, Pages 271–280
نویسندگان
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