کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
5006067 1461383 2017 6 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Origins of photoluminescence degradation in porous silicon under irradiation and the way of its elimination
ترجمه فارسی عنوان
ریشه های تخریب فوتولومینسانس در سیلیکن متخلخل تحت اشعه و روش حذف آن
موضوعات مرتبط
مهندسی و علوم پایه سایر رشته های مهندسی مهندسی برق و الکترونیک
چکیده انگلیسی
Using of infrared (IR) and photoluminescence (PL) spectroscopy a comparative study of distinctions in composition and photoluminescence properties of porous silicon with different morphology was performed. Basing on the obtained experimental data and conventional theoretical models the main factors were found that have a negative effect on the intensity of PL in porous silicon and its degradation under the impact of directed irradiation in the visible range. With porous silicon as an example having the pores of 50-100 nm in size there was demonstrated a possibility for improving of these characteristics by its chemical treatment in polyacrylic acid.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Materials Science in Semiconductor Processing - Volume 64, 15 June 2017, Pages 71-76
نویسندگان
, , , ,