کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
7724932 | 1497837 | 2018 | 10 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Performance and stability of large planar solid oxide fuel cells using phosphine contaminated hydrogen fuel
ترجمه فارسی عنوان
عملکرد و پایداری سلول های سوخت جامد اکسید جامد با استفاده از سوخت هیدروژن آلوده فسفین
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
شیمی
الکتروشیمی
چکیده انگلیسی
Coal syngas, a potential fuel for SOFCs, contains impurities like PH3, which rapidly degrade Ni-based SOFC anodes. Past research showed significant reconstruction of Ni anodes in button cells with degradation rates of â¼0.5â¯mVâhâ1. It is not evident that these rates correspond to actual stack applications due to major differences in fuel utilization and delivery. Herein, a single planar repeat unit with an active area of 32.64â¯cm2 is constructed using a Haynes® 242 manifold. The cell operates at 800â¯Â°C using dry H2 with and without 10â¯ppm PH3. The cell employs a co-flow configuration with a fuel utilization of 12.5%. The performance of the cell is evaluated over 440â¯h by voltage-current measurements and electrochemical impedance spectroscopy. The post-run analysis of the contaminated cell is conducted via XRD, XPS and SEM. The degradation rate for the cell is found to be 3Ã10â3â¯mVâhâ1, which is far lower than that reported previously. The cell shows low evidence of significant PH3 poisoning and there is no reconstruction of the Ni-anode microstructure, as seen in button cell testing. Some basic electrochemical and thermodynamic modeling, and microstructural/chemical characterization are presented and related to the cell's relatively stable performance observed in this work.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Journal of Power Sources - Volume 395, 15 August 2018, Pages 185-194
Journal: Journal of Power Sources - Volume 395, 15 August 2018, Pages 185-194
نویسندگان
T.B.A. Ross, J.W. Zondlo, E.M. Sabolsky, E. Ciftyurek, A. Koneru, T. Thomas, I. Celik, X. Liu, H. Sezer, U.M. Damo,