کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
846637 909210 2016 8 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Thickness dependence of infrared reflectance of ultrathin metallic films: Influence of quantum confinement
ترجمه فارسی عنوان
وابستگی ضخامت انعکاس مادون قرمز فیلم های فلزی فوق العاده: تأثیر محدوده کوانتومی
موضوعات مرتبط
مهندسی و علوم پایه سایر رشته های مهندسی مهندسی (عمومی)
چکیده انگلیسی

In this letter we discuss experimental results on optical reflectance of ultrathin metallic films. The laser light source was tuned at the infrared wavelength of λ=9.2μmλ=9.2μm. Three metals were tested: aluminum, niobium, and nickel. The thin films were coated on various wafers, namely, fused glass, α-quartz and amorphous silicon, with the technique of magnetic field assisted sputtering modulated at radio frequencies. The infrared reflectance was recorded while the thickness of the film varied from 5 to little more than 100 Å. A phenomenon is observed, i.e. a periodic oscillation appeared modulated on the otherwise classic thickness dependence of metallic films. The effects are attributed to the influence of quantum confinement induced intraband redistribution of conduction electrons. A one-dimensional quantum well model was employed to simulate the system, and the numerical results confirmed the existence of the quantum size effect.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Optik - International Journal for Light and Electron Optics - Volume 127, Issue 15, August 2016, Pages 5920–5927
نویسندگان
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