کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
8948430 | 1645668 | 2018 | 7 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Study of micro-structural, optical and electrical properties of TiO2 films obtained from micro-controller based SILAR method
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موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
سرامیک و کامپوزیت
پیش نمایش صفحه اول مقاله
چکیده انگلیسی
The TiO2 films were obtained from successive ion layer adsorption and reaction (SILAR) method. A micro-controller based SILAR unit was used to precisely monitor and control the deposition parameters. The films were uniform and free from physical defects such as pores and cracks. A maximum thickness of about 700â¯nm was achieved. The films were found to be polycrystalline without any texture or preferred orientations. The crystallite size of the films was found to increase with thickness while the micro strain and stress were found to reduce with the thickness. Post-deposition annealing was also found to produce the similar results. The films were found to possess an indirect bandgap of about 3â¯eV. Various technically important parameters such as root-mean-square micro strain, Urbach energy, chemical composition, carrier concentration, electrical resistivity etc. were determined. The effects of deposition parameters on the properties of the films is discussed in detail.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Ceramics International - Volume 44, Issue 15, 15 October 2018, Pages 17623-17629
Journal: Ceramics International - Volume 44, Issue 15, 15 October 2018, Pages 17623-17629
نویسندگان
Ashith V.K., Gowrish K. Rao, Smitha R., Sahana N. Moger,