Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
10146542 | Optics and Lasers in Engineering | 2019 | 7 Pages |
Abstract
A robust phase unwrapping algorithm based on reliability mask and weighted minimum least-squares method is proposed. The reliability mask is a 0-1 mask generated according to the reliability map of a wrapped phase map, which is calculated based on the second differences of each pixel. This mask not only ensures the reliability of weighting coefficients but also retains the ability of the 0-1 mask to prevent the noise values from influencing the results. The principle and realization of the proposed algorithm are described in detail. Experiments involving both simulated and actual wrapped phase images are performed to verify the feasibility and effectiveness of the proposed algorithm under various noise conditions. The results show that the proposed method can provide a more reliable and more accurate unwrapped phase, which indicates that our algorithm is more suitable for high-precision phase unwrapping of the actual wrapped phases containing various and complex noises.
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Electrical and Electronic Engineering
Authors
Yan Liping, Zhang Haiyan, Zhang Rui, Xie Xin, Chen Benyong,