Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
10227050 | Corrosion Science | 2018 | 37 Pages |
Abstract
Low-energy self-ion bombardment effects on the crystallographic orientation and oxidation behaviours of arc-ion-plated pure Cr films were investigated. Microstructurally compact Cr films as observed by SEM were obtained under ion-bombardment energy of 50-250âeV. Stronger ion bombardment induced crystallographic orientation of Cr (200) and slight self-sputtering effect in the Cr films. Oxidation of the Cr films at 900â°C showed that the stronger self-ion bombardment induced formation of the more compact chromia scales with significantly lowered growth rate, indicating that self-ion bombardment can be an effective approach to improve the oxidation resistance of metal films.
Related Topics
Physical Sciences and Engineering
Materials Science
Ceramics and Composites
Authors
Ming Hu, Mingli Shen, Zhengliang Liu, Cean Guo, Qiang Li, Shenglong Zhu,