| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 10248901 | Solar Energy Materials and Solar Cells | 2005 | 7 Pages |
Abstract
We propose a technique for detecting unevenness and abnormalities in the active area of a thin-film solar module based on measurement of its I-V characteristics using a line light. The outline of this technique and the results of an evaluation experiment are described. This method can be applied to the evaluation of the module's performance and to the detection of defects.
Keywords
Related Topics
Physical Sciences and Engineering
Chemical Engineering
Catalysis
Authors
Takeshi Yanagisawa, Takeshi Kojima,