| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 10249138 | Solar Energy Materials and Solar Cells | 2005 | 9 Pages |
Abstract
In this study, we have carefully analysed the performance degradation in an edge-defined film-fed growth (EFG) module due to delamination and moisture ingress. Our results showed that this degradation is directly related to the delamination as well as the moisture ingress. We also found that during hot, dry periods (December-January), there is a small reversal in degradation, which is due to the regression of the moisture ingress. The presence of moisture in the delaminated regions has led to the deterioration in cell interconnects. This is observed by the increase in series resistance with time.
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Authors
E.E. van Dyk, J.B. Chamel, A.R. Gxasheka,