Article ID Journal Published Year Pages File Type
10292973 NDT & E International 2005 5 Pages PDF
Abstract
The single oscillator energy (Eo) and the energy dispersion parameter (Ed) have been calculated and discussed in terms of the Wemple and DiDomenico model. The results reveal that, they are thickness dependent-both Eo and Ed being higher for the undoped samples than that for the doped films.
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Physical Sciences and Engineering Engineering Civil and Structural Engineering
Preview
Surface roughness and dispersion parameters of indium doped amorphous As2Se3 thin films
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