Article ID Journal Published Year Pages File Type
10406998 Materials Science in Semiconductor Processing 2013 6 Pages PDF
Abstract
The effect of crystalline defects such as dislocations and grain boundary on the cutting behavior of multicrystalline solar silicon is investigated. Diamond scribing experiments reveal significant intra-granular variations in the critical depth of cut for ductile-to-brittle transition in the material. This is explained by characterizing the local dislocation density variations in (100) and (311) grains of a cast multicrystalline silicon wafer and measuring the corresponding elastic modulus, nanoindentation hardness, and fracture toughness. Measured elastic moduli are shown to be higher than theoretical values for defect-free single crystal silicon of the same crystallographic plane. For a given grain orientation, a higher dislocation density is shown to be correlated with higher fracture toughness and a larger critical depth of cut.
Related Topics
Physical Sciences and Engineering Engineering Electrical and Electronic Engineering
Authors
, ,