Crystal growth and characterizations of diluted magnetic semiconductor MnxCd1−xIn2Te4

Single crystals of diluted magnetic semiconductor Cd1−xMnxIn2Te4 with x=0.1, 0.22 and 0.4 were grown by the Bridgman method. Several regions composed of α+β1, α+β+β1, β and In2Te3+Te phases were found to crystallize in orders due to the solute partition at the growth interface. The magnetic susceptibility and Kerr effect of β-phase crystals with different compositions cut from the ingot were measured. The results revealed the anti-ferromagnetic interactions between Mn2+ ions in the crystal. Meanwhile, the negative rotation angles for x=0.1 and 0.22 and positive with small values for x=0.4 were detected.