Article ID Journal Published Year Pages File Type
10407261 Materials Science in Semiconductor Processing 2005 15 Pages PDF
Abstract
The trench filling of depositing copper atoms on the titanium layer in a damascene process was studied using molecular dynamics simulation with the embedded atom method (EAM) as interaction potential for the present alloy metal system. A three-layer trench model consisting of the barrier, thermal control, and fixed layers was used. The effects of different process parameters on the trench-filling morphologies and microstructures including incident energies of depositing atoms and substrate temperatures were investigated. The present results using invariance-preserving alloy model are discussed in terms of void formation, coverage percentage, and alloy fraction and compared with simple arithmetic average alloy model.
Related Topics
Physical Sciences and Engineering Engineering Electrical and Electronic Engineering
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