| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 10407310 | Measurement | 2013 | 11 Pages |
Abstract
The paper presents a completely new realization of implicit RMS detector, employing dual-output second-generation current conveyors (DO-CCIIs) and metal-oxide-semiconductor transistors. The proposed circuit can be applied in measuring the RMS value of multiharmonic signals. To verify the theoretical analysis, the circuit SPICE simulations and experimental results have also been included, showing good agreement with the theory. The errors related to the signal processing and errors bound were investigated and provided. A processing precision of 0.05% was achieved. Inherently, the circuit is well suited for IC implementation.
Related Topics
Physical Sciences and Engineering
Engineering
Control and Systems Engineering
Authors
Predrag B. PetroviÄ, Ivan Ž. Župunski,