| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 10407453 | Measurement | 2005 | 8 Pages |
Abstract
A systematic study on various resonance measurement techniques of dielectric constant and dielectric loss at microwave frequencies has been undertaken. Characteristics of various resonance techniques are compared with each other. Suggestion on how to select adequate measurement techniques of microwave dielectric properties is given. Practical measurements by different methods are made and the results are compared. The trend for future development is discussed.
Related Topics
Physical Sciences and Engineering
Engineering
Control and Systems Engineering
Authors
Jyh Sheen,