| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 10408563 | Optics and Lasers in Engineering | 2011 | 7 Pages |
Abstract
⺠One to two ratio rotating polarizer analyzer ellipsometer is constructed. ⺠Mathematical analysis is shown in detail. ⺠Optical properties of c-Si, Au, and ZnSe were obtained experimentally. ⺠Two ellipsometry standards were investigated.
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Authors
Taher M. El-Agez, Sofyan A. Taya,