| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 10408651 | Optics and Lasers in Engineering | 2013 | 6 Pages |
Abstract
⺠This study investigates the curing process under different intensity profiles. ⺠Electrical resistivity and scratch resistance of cured samples are tested. ⺠FEM simulations are used to validate the results.
Keywords
Related Topics
Physical Sciences and Engineering
Engineering
Electrical and Electronic Engineering
Authors
Shuo Shang, Dan Wellburn, Eamonn Fearon, Shilian Yan, Stuart Edwardson, G. Dearden, K.G. Watkins,