Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
10411135 | Solid-State Electronics | 2005 | 5 Pages |
Abstract
We reported the growth and its electrical properties of [1Â 0Â 0]-oriented diamond film using alcohol and hydrogen by HFCVD. SEM and Raman measurements indicated that high quality polycrystalline diamond films with [1Â 0Â 0]-faced structure were obtained. Dark current-voltage (I-V), capacitance-frequency (C-F), capacitance-voltage (C-V) and photocurrent under steady-state 55Fe 5.9Â keV X-ray excitation of freestanding diamond film were investigated at room temperature. Results indicated that after post-annealing for [1Â 0Â 0]-oriented diamond films dark current was in the order of 10â10Â A and the photocurrent was of in the order 10â8Â A by X-ray irradiation with the applied voltage of 40Â V, capacitance and dielectric loss were very small with the value of 2Â pF and 2Â ÃÂ 10â3 with the bias voltage of 0.05Â V, respectively, and almost had no variation with the change of frequency in high frequencies from 100Â kHz to 10Â MHz.
Related Topics
Physical Sciences and Engineering
Engineering
Electrical and Electronic Engineering
Authors
Qingfeng Su, Jinfang Lu, Linjun Wang, Jianmin Liu, Jianfeng Ruan, Jiangtao Cui, Weimin Shi, Yiben Xia,