Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
10411194 | Solid-State Electronics | 2005 | 8 Pages |
Abstract
An analytical charge control model for sheet carrier density is presented for InAlAs/InGaAs/InAlAs double heterostructure high electron mobility transistor (DH-HEMT). The model uses a polynomial dependence of sheet carrier concentration on position of quasi-Fermi energy level to successfully predict the gradual saturation of charge in the device and is valid from subthreshold region to high conduction region for both the channels. The model has been extended to calculate Id-Vd characteristics, transconductance and cut-off frequency of the device.
Related Topics
Physical Sciences and Engineering
Engineering
Electrical and Electronic Engineering
Authors
Ritesh Gupta, Sandeep Kumar Aggarwal, Mridula Gupta, R.S. Gupta,