Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
10411591 | Solid-State Electronics | 2016 | 6 Pages |
Abstract
Random Telegraph Noise (RTN) is one of the main reliability problems of resistive switching-based memories. To understand the physics behind RTN, a complete and accurate RTN characterization is required. The standard equipment used to analyse RTN has a typical time resolution of â¼2 ms which prevents evaluating fast phenomena. In this work, a new RTN measurement procedure, which increases the measurement time resolution to 2 μs, is proposed. The experimental set-up, together with the recently proposed Weighted Time Lag (W-LT) method for the analysis of RTN signals, allows obtaining a more detailed and precise information about the RTN phenomenon.
Related Topics
Physical Sciences and Engineering
Engineering
Electrical and Electronic Engineering
Authors
M. Maestro, J. Diaz, A. Crespo-Yepes, M.B. Gonzalez, J. Martin-Martinez, R. Rodriguez, M. Nafria, F. Campabadal, X. Aymerich,