| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 10411618 | Solid-State Electronics | 2011 | 8 Pages |
Abstract
⺠New criteria for occurrence of the diffusion mode were formulated. ⺠The applicability limits of the diffusion approximation in simulation were found. ⺠The analytical results are confirmed by a numerical experiment.
Related Topics
Physical Sciences and Engineering
Engineering
Electrical and Electronic Engineering
Authors
Tigran T. Mnatsakanov, Alexey G. Tandoev, Michael E. Levinshtein, Sergey N. Yurkov,