Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
10411679 | Solid-State Electronics | 2005 | 6 Pages |
Abstract
The dark current density-voltage characteristics of Au/p-ZnPc/p-Si device at different temperatures ranging from 302 to 364 K have been investigated. Results showed a rectification behavior. At low forward bias, the current density was found to limited by the thermionic emission of holes from p-Si over the organic/inorganic barrier in the ZnPc thin film, while at high voltages, space charge limited current mechanism dominated by a single trapping level. Junction parameters such as, built-in potential, Vbi, carrier concentration, N, the width of the depletion layer, W, were obtained from the C-V measurements. The current density-voltage characteristics under light illumination provided by tungsten lamp (200 W/m2) gives values of 0.44 V, 31.25 A/m2, 0.335% and 2.3% for the open circuit voltage, Voc, the short circuit current density, Jsc, the fill factor, FF, and conversion efficiency, η, respectively.
Keywords
Related Topics
Physical Sciences and Engineering
Engineering
Electrical and Electronic Engineering
Authors
M.M. El-Nahass, H.M. Zeyada, M.S. Aziz, N.A. El-Ghamaz,