Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
10411703 | Solid-State Electronics | 2005 | 4 Pages |
Abstract
SiO2 films were successfully deposited onto n-GaAs substrates by photo-chemical vapor deposition (photo-CVD) using a deuterium (D2) lamp as the excitation source. With a 1 MV/cm applied electric field, it was found that the SiO2 films leakage current densities were 1.74 Ã 10â6 and 1.97 Ã 10â7 A/cm2, respectively, for the capacitors with as-deposited and 400 °C annealed insulator layers. The interface state densities, Dit, were also found to be small for the fabricated Al/photo-CVD-SiO2/GaAs metal-oxide-semiconductor field effect transistors (MOSFETs) capacitors.
Related Topics
Physical Sciences and Engineering
Engineering
Electrical and Electronic Engineering
Authors
C.H. Liu, T.K. Lin, S.J. Chang,