Article ID Journal Published Year Pages File Type
10413343 Solid-State Electronics 2005 4 Pages PDF
Abstract
This article describes a novel EEPROM cell, suitable for application at high-temperatures. Measurement results obtained from this cell are presented, as well as a simulation model for this cell. Furthermore, the means of memory design using this novel cell will be indicated.
Related Topics
Physical Sciences and Engineering Engineering Electrical and Electronic Engineering
Authors
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