Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
10413343 | Solid-State Electronics | 2005 | 4 Pages |
Abstract
This article describes a novel EEPROM cell, suitable for application at high-temperatures. Measurement results obtained from this cell are presented, as well as a simulation model for this cell. Furthermore, the means of memory design using this novel cell will be indicated.
Keywords
Related Topics
Physical Sciences and Engineering
Engineering
Electrical and Electronic Engineering
Authors
Sonja Richter, Dagmar Kirsten, Steffen Richter, Dirk Nuernbergk,