Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
10420074 | Reliability Engineering & System Safety | 2005 | 10 Pages |
Abstract
In this article, we show how fault tree analysis, carried out by means of binary decision diagrams (BDD), is able to approximate reliability of systems made of independent repairable components with a good accuracy and a good efficiency. We consider four algorithms: the Murchland lower bound, the Barlow-Proschan lower bound, the Vesely full approximation and the Vesely asymptotic approximation. For each of these algorithms, we consider an implementation based on the classical minimal cut sets/rare events approach and another one relying on the BDD technology. We present numerical results obtained with both approaches on various examples.
Related Topics
Physical Sciences and Engineering
Engineering
Mechanical Engineering
Authors
Y. Dutuit, A. Rauzy,