Article ID Journal Published Year Pages File Type
10420074 Reliability Engineering & System Safety 2005 10 Pages PDF
Abstract
In this article, we show how fault tree analysis, carried out by means of binary decision diagrams (BDD), is able to approximate reliability of systems made of independent repairable components with a good accuracy and a good efficiency. We consider four algorithms: the Murchland lower bound, the Barlow-Proschan lower bound, the Vesely full approximation and the Vesely asymptotic approximation. For each of these algorithms, we consider an implementation based on the classical minimal cut sets/rare events approach and another one relying on the BDD technology. We present numerical results obtained with both approaches on various examples.
Related Topics
Physical Sciences and Engineering Engineering Mechanical Engineering
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