| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 10482074 | Physica A: Statistical Mechanics and its Applications | 2013 | 8 Pages |
Abstract
⺠A method for the analysis and characterization of nanostructured material images acquired from FEG-SEM is proposed. ⺠Based on volumetric fractal descriptors, the technique extracts metrics from the texture of the image. ⺠An experiment with anodic titanium oxide was conducted. ⺠The approach demonstrated was capable of characterizing complex morphology characteristics.
Related Topics
Physical Sciences and Engineering
Mathematics
Mathematical Physics
Authors
João B. Florindo, Mariana S. Sikora, Ernesto C. Pereira, Odemir M. Bruno,