| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 10546392 | Journal of the American Society for Mass Spectrometry | 2009 | 9 Pages |
Abstract
Radical and even-electron product ion yield in ion trap-based ETD differs from ECD FT-ICR MS. ETD and CRCID distinguish short and long-lifetime radical intermediate complexes.
Related Topics
Physical Sciences and Engineering
Chemistry
Analytical Chemistry
Authors
Hisham Ben Hamidane, Diego Chiappe, Ralf Hartmer, Aleksey Vorobyev, Marc Moniatte, Yury O. Tsybin,