| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 10546672 | Journal of the American Society for Mass Spectrometry | 2009 | 8 Pages |
Abstract
An imaging LA-ICP-MS procedure was developed to map the elements of interest (Au, Ti, Pt, Cr) on the surface IDA-chip. For the analysis at nanometer resolution scale, a near-field-LA-ICP-MS procedure was applied.
Related Topics
Physical Sciences and Engineering
Chemistry
Analytical Chemistry
Authors
Myroslav V. Zoriy, Dirk Mayer, J. Sabine Becker,