| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 10547030 | Journal of the American Society for Mass Spectrometry | 2005 | 7 Pages |
Abstract
The source of discoloration on a polymer surface can often be identified by washing the surface of the discolored polymer to collect the color bodies, then analyzing the washings using liquid chromatography-mass spectrometry (LCMS), with an in-line ultraviolet (UV) detector set at the optimum wavelength for the particular color bodies. A reference sample having no discoloration is also analyzed in the same way. In this paper, results from this methodology are compared with direct time of flight-secondary ion mass spectrometry (TOF-SIMS) analysis of a discolored polymer. The benefits and shortcomings of each methodology are discussed.
Related Topics
Physical Sciences and Engineering
Chemistry
Analytical Chemistry
Authors
Colin Moore, Pat McKeown,