Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
10547189 | Journal of the American Society for Mass Spectrometry | 2005 | 8 Pages |
Abstract
Significant enhancements in ion yields in time-of-flight secondary ion mass spectrometry (TOF-SIMS) are observed when water-soluble analytes are mixed with a polyelectrolyte, e.g., poly(diallyldimethylammonium chloride) or poly(sodium 4-styrenesulfonate), and then deposited in the layer-by-layer method on a surface. This previously unobserved effect is demonstrated for 5-chloro-8-methoxyquinoline appended diaza-18-crown-6, 5-(2-aminoethoxy)methyl-5-chloro-8-methoxyquinoline appended diaza-18-crown-6, acridine, 9-anthracenecarboxylic acid, and ferrocenecarboxylic acid. By optical ellipsometry film thicknesses range from ca. 5-20 Ã
. X-ray photoelectron spectroscopy shows significantly less analyte in the polyelectrolyte-analyte films than in the neat analytes. However, TOF-SIMS generally shows significant enhancements in ion yields from the polyelectrolyte films compared with either the neat compounds or the compounds solubilized with acid or base and then dried on a surface. These significant enhancements in ion yields also appear to extend to analyte fragments and cationized molecular species. Some enhancement is also observed for dried droplets of analytes mixed with a polyelectrolyte on surfaces.
Related Topics
Physical Sciences and Engineering
Chemistry
Analytical Chemistry
Authors
Yit-Yian Lua, Li Yang, Craig A. Pew, Feng Zhang, W. Jonathan J. Fillmore, R. Todd Bronson, Amarchand Sathyapalan, Paul B. Savage, Jed D. Whittaker, Robert C. Davis, Matthew R. Linford,