| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 10558334 | Spectrochimica Acta Part A: Molecular and Biomolecular Spectroscopy | 2005 | 9 Pages |
Abstract
Positron annihilation spectroscopy (PAS), coupled with a variable mono-energetic positron beam, has been used to investigate surface and interfacial properties in thin polymeric films. Free-volume properties have been measured from ortho-Positronium (o-Ps) lifetime and the S parameter of Doppler broadening of energy spectra from annihilation radiation as a function of the depth and of the temperature in thin polymeric films. Depth profiles of glass transition temperature and nanoscale layered structures in polystyrene (PS) thin films on the Si substrate are presented.
Related Topics
Physical Sciences and Engineering
Chemistry
Analytical Chemistry
Authors
Y.C. Jean, Junjie Zhang, Hongmin Chen, Ying Li, Guang Liu,