Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
10559093 | Spectrochimica Acta Part B: Atomic Spectroscopy | 2005 | 6 Pages |
Abstract
Commercial polyethylenes produced by Ziegler-Natta, Philips and metallocene technology were analyzed by X-ray fluorescence spectroscopy. Synthetic standards using wax matrix was shown to be suitable for the calibration curve in comparison to those prepared by milling and grinding virgin polymer mixed with standard metal oxide as matrix. The detection limits obtained for the studied metal in the different polymers were: 12 mg kgâ1 for Mg, 0.8 mg kgâ1 for Ti, 1.6 mg kgâ1 for Cr, 1.2 mg kgâ1 for Zr and 1.9 mg kgâ1 for V. For comparative reasons, the determination of residual metal content by Rutherford backscattering spectrometry (RBS) and total-reflection X-ray fluorescence spectrometry (TXRF) is also discussed.
Related Topics
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Authors
Kátia M. Bichinho, Gilvan Pozzobon Pires, Fernanda C. Stedile, João Henrique Z. dos Santos, Carlos Rodolfo Wolf,