| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 10559614 | Talanta | 2009 | 8 Pages |
Abstract
The proposed methodology is presented as a control technique to detect batch variability, defects in final tablets and punctual contaminants, being a potential supplementary tool for quality controls. In addition, the usefulness of the proposed methodology is not exclusive to NIR-CI devices, but to any hyperspectral and multivariate image system.
Keywords
Related Topics
Physical Sciences and Engineering
Chemistry
Analytical Chemistry
Authors
Carlos Cairós, José Manuel Amigo, Robert Watt, Jordi Coello, Santiago Maspoch,