| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 10564290 | TrAC Trends in Analytical Chemistry | 2005 | 9 Pages |
Abstract
Techniques for the analysis of trace elements have developed rapidly in response to the increasing need for accurate measurements at extremely low amount of contents in diverse matrices. We review potentiometric, voltammetric, atomic spectrometric, X-ray and nuclear techniques and discuss the extent to which they have been shown to give comparable results in typical applications.
Related Topics
Physical Sciences and Engineering
Chemistry
Analytical Chemistry
Authors
Richard J.C. Brown, Martin J.T. Milton,