| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 10566151 | Organic Electronics | 2013 | 5 Pages |
Abstract
⺠Dynamic characterization of OTFTs is demonstrated by S-parameter measurements. ⺠OTFT small-signal model simulations fit the S-parameter measurements closely. ⺠Impact of contact misalignment on the dynamic performance of OTFTs is investigated. ⺠Misalignment is controlled by an OTFT process that is based on silicon stencil masks. ⺠Actual contact misalignment of OTFTs can be extracted from S-parameter measurements.
Related Topics
Physical Sciences and Engineering
Chemistry
Chemistry (General)
Authors
Tarek Zaki, Reinhold Rödel, Florian Letzkus, Harald Richter, Ute Zschieschang, Hagen Klauk, Joachim N. Burghartz,