| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 10566633 | Organic Electronics | 2013 | 9 Pages |
Abstract
⺠We fabricated orthogonal soluble polymer stacks and probed the buried interface by X-ray reflectivity. ⺠Depending on the used solvent of the organic semiconducting material the interface morphology changed significantly. ⺠Grazing incidence X-ray diffraction exhibits the molecule alignment in the investigated polymer stack. ⺠The buried interface roughness within the polymer stack was correlated to the OTFT performance containing the stack.
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Physical Sciences and Engineering
Chemistry
Chemistry (General)
Authors
Alfred Neuhold, Hannes Brandner, Simon J. Ausserlechner, Stefan Lorbek, Markus Neuschitzer, Egbert Zojer, Christian Teichert, Roland Resel,