| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 10612020 | Dental Materials | 2015 | 10 Pages |
Abstract
Micron-scale focused ion beam (FIB) ring-core methods allow for high-resolution residual stress profiling of dental prostheses materials.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Biomaterials
Authors
M. Sebastiani, F. Massimi, G. Merlati, E. Bemporad,