| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 10612671 | Journal of Controlled Release | 2015 | 7 Pages |
Abstract
Potential systematic bias in particle tracking of heterogeneous systems: Mobile particles can enter and leave the focal plane multiple times, resulting in more traces recorded than for strongly hindered particles.244
Related Topics
Physical Sciences and Engineering
Materials Science
Biomaterials
Authors
Ying-Ying Wang, Kenetta L. Nunn, Dimple Harit, Scott A. McKinley, Samuel K. Lai,