| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 10628762 | Corrosion Science | 2005 | 8 Pages |
Abstract
During anodising of Al-Cu alloys, copper species are incorporated into the anodic alumina film, where they migrate outward faster than Al3+ ions. In the present study of an Al-1at.% Cu alloy, the valence state of the incorporated copper species was investigated by X-ray photoelectron spectroscopy, revealing the presence of Cu2+ ions within the amorphous alumina film. However, extended X-ray irradiation led to reduction of units of CuO to Cu2O, probably due mainly to interactions with electrons from the X-ray window of the instrument and photoelectrons from the specimen. The XPS analysis employed films formed on thin sputtering-deposited alloy/electropolished aluminium specimens. Such an approach enables sufficient concentrations of copper species to be developed in the anodic film for their ready detection.
Related Topics
Physical Sciences and Engineering
Materials Science
Ceramics and Composites
Authors
X. Zhou, G.E. Thompson, P. Skeldon, K. Shimizu, H. Habazaki, G.C. Wood,