Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
10632191 | Materials Research Bulletin | 2005 | 10 Pages |
Abstract
Thin ferroelectric films of PLTx (Pb1âxLaxTi1âx/4O3) have been prepared by a sol-gel spin coating process. As deposited films were thermally treated for crystallization and formation of perovskite structure. Characterization of these films by X-ray diffraction (XRD) have been carried out for various concentrations of La (x = 0.04, 0.08 and 0.12) on ITO coated corning glass substrates. For a better understanding of the crystallization mechanism, the investigations were carried out on films annealed at temperatures (350, 450, 550 and 650 °C). Characterization of these films by X-ray diffraction shows that the films annealed at 650 °C exhibit tetragonal phase with perovskite structure. Atomic force microscope (AFM) images are characterized by slight surface roughness with a uniform crack free, densely packed structure. Fourier transform infrared spectra (FTIR) studies of PLTx thin films (x = 0.08) deposited on Si substrates have been carried out to get more information about the phase stabilization.
Related Topics
Physical Sciences and Engineering
Materials Science
Ceramics and Composites
Authors
Sonalee Chopra, Seema Sharma, T.C. Goel, R.G. Mendiratta,