Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
10633535 | Optical Materials | 2005 | 5 Pages |
Abstract
Au/TiO2/SiO2 sandwich composite multilayer films were deposited by alternating multitarget magnetron sputtering technique. Annealing process was performed for as-growth. Au particles appeared between the layers and grew with the increasing of the annealing temperature. The surface plasmon resonance of the annealed films is around 570-590Â nm. The third-order nonlinear susceptibility was measured with the backward degenerate four wave mixing (DFWM) scheme at a 532Â nm wavelength. The calculated values of Ï(3) at 532Â nm of the composite films are larger than 1.02Â ÃÂ 10â6Â esu. We assume the multilayer sandwich topology of the Au/TiO2/SiO2 composite films has greatly enhanced the local field factor f and caused a larger Ï(3) which is even not measured at the wavelength near the surface plasmon resonance of the composite materials.
Related Topics
Physical Sciences and Engineering
Materials Science
Ceramics and Composites
Authors
S.W. Yu, H.B. Liao, W.J. Wen, G.K.L. Wong,