Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
10633674 | Optical Materials | 2005 | 4 Pages |
Abstract
In this work the site of Er ions in a silica matrix containing Si nanoclusters (nc) is investigated. The Er ions are introduced into a silica matrix containing Si nanoclusters by ion implantation. The X-ray absorption spectroscopy (EXAFS), performed at Er LIII-edge shows that the Er site in the matrix strongly depends on the preparation conditions; the effect of the implantation dose on the local structure around Er is addressed. The data demonstrate that the Er atoms are surrounded in the first shell by O atoms. Moreover, an increasing in the Er implantation dose implies an increase of the number of O atoms in the first shell and of their distance to the Er central atom, leading to the formation of a Er site more similar to that of bulk Er2O3.
Related Topics
Physical Sciences and Engineering
Materials Science
Ceramics and Composites
Authors
C. Maurizio, F. D'Acapito, F. Priolo, G. Franzò, F. Iacona, E. Borsella, S. Padovani, P. Mazzoldi,