Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
10634222 | Scripta Materialia | 2005 | 4 Pages |
Abstract
Three apparently distinct and different approaches have been proposed to account for the crystallographic features of diffusion-controlled precipitation. These three models are based on (a) an invariant line in the habit plane, (b) the parallelism of a pair of Îgs that are perpendicular to the habit plane and (c) the parallelism of a pair of Moiré fringes that are in turn parallel to the habit plane. The purpose of the present paper is to show that these approaches are in fact absolutely equivalent and that when certain conditions are satisfied they are essentially the same as the recent edge-to-edge matching model put forward by the authors.
Related Topics
Physical Sciences and Engineering
Materials Science
Ceramics and Composites
Authors
P.M. Kelly, M-X. Zhang,