| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 10634255 | Scripta Materialia | 2005 | 5 Pages |
Abstract
Structure evolution of silicon clusters under electron irradiation has been investigated in situ by high-resolution transmission electron microscopy. Silicon nanocrystals show an unusual structure and experience a transformation from two-dimensional-order to a crystal. The transformation is mainly due to the increase in cluster size; knock-on displacement helps defects to escape from the nanocrystals.
Related Topics
Physical Sciences and Engineering
Materials Science
Ceramics and Composites
Authors
X.-W. Du, B. Wang, N.Q. Zhao, K. Furuya,