Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
10634301 | Scripta Materialia | 2005 | 6 Pages |
Abstract
The Bauschinger effect in thin sputter-deposited Al and Cu films is studied by isothermally deforming the films alternately in tension and compression. Passivated films exhibit an unusual Bauschinger effect with reverse flow already occurring on unloading, while unpassivated films show little or no reverse flows when the film is fully unloaded.
Related Topics
Physical Sciences and Engineering
Materials Science
Ceramics and Composites
Authors
Y. Xiang, J.J. Vlassak,