Article ID Journal Published Year Pages File Type
10634301 Scripta Materialia 2005 6 Pages PDF
Abstract
The Bauschinger effect in thin sputter-deposited Al and Cu films is studied by isothermally deforming the films alternately in tension and compression. Passivated films exhibit an unusual Bauschinger effect with reverse flow already occurring on unloading, while unpassivated films show little or no reverse flows when the film is fully unloaded.
Related Topics
Physical Sciences and Engineering Materials Science Ceramics and Composites
Authors
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