| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 10635034 | Scripta Materialia | 2005 | 6 Pages |
Abstract
The uncertainty of facet crystallography measured by stereology and electron backscattered diffraction is less than 3°, based on multiple measurements on an oriented Si single crystal and an Al-Li-Cu alloy fatigue crack. This provides a guideline for the characterization of physically meaningful differences in facet crystallography, which in turn guides damage mechanism assessment.
Related Topics
Physical Sciences and Engineering
Materials Science
Ceramics and Composites
Authors
Y.J. Ro, S.R. Agnew, R.P. Gangloff,