Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
10639952 | Materials Science and Engineering: B | 2005 | 6 Pages |
Abstract
We report a scanning microwave near-field microscope that allows temperature-dependent local electromagnetic characterization of electronic materials. We have established a temperature-controlled sample stage cooled by liquid nitrogen, so that the local electromagnetic properties of the sample could be studied through near-field microwave interaction at temperature varying from 80 to 300 K. Using this instrument, we have studied the magnetic phase transition of an Nd0.7Sr0.3MnO3âδ thin film and an ion-pair complex magnetic material, as well as the homogeneity of the microwave surface resistance of a YBa2Cu3O7âδ superconducting thin film. Experiment results have demonstrated the ability of temperature-dependent local microwave characterization of this microwave microscope for different kind of electronic materials.
Related Topics
Physical Sciences and Engineering
Materials Science
Electronic, Optical and Magnetic Materials
Authors
Y.J. Feng, T. Jiang, J. Sun, L.Y. Wu, K.L. Wang,