Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
10639979 | Materials Science and Engineering: B | 2005 | 6 Pages |
Abstract
The effect of substrate temperature on structural and optical properties of vacuum evaporated ZincPhthalocyanine (ZnPc) thin films have been studied by the X-ray diffraction method (XRD) and spectrophotometer, respectively. The X-ray diffraction analysis of vacuum evaporated ZnPc films reveals that the metastable α-ZnPc phase to stable β-ZnPc phase transformation is identified due to different substrate temperatures. The orientations of the ZnPc molecules are arranged parallel to the substrate surface and confirmed by the SEM and XRD analysis. The band gap energy was decreased from 1.82 to 1.67 eV when the substrate temperature increases.
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Authors
S. Senthilarasu, R. Sathyamoorthy, S.K. Kulkarni,